Abstract
In the present work, we report the fabrication and characterization of undoped ZnO and Cadmium Sulfide (CdS) and Zinc Oxide (ZnO) thick films. The structural properties of ZnO films are characterized by X-ray Diffraction (XRD). It is evident from XRD that, the crystallite size of fabricated ZnO and CdS-ZnO films are 45 nm and 38 nm respectively. Optical properties have been investigated by U-V absorption. It is observed from U-V Spectroscopy that the band gap decreases with CdS doping. We found that all deposited ZnO thin films are to be polycrystalline structures of wurtzite, and the crystallite size of ZnO is in the nanometric range which further decreases with CdS doping.
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