Abstract
In this study, were investigated structural, optical properties and morphological of Te Nano-thin films with different thicknesses by Chemical spray pyrolysis (CSP) method. The structural properties of the films were studied as a Te dopant at 150-450 thicknesses. The films were characterized by XRD to study film structure. It was observed that the hexagonal wurtzite structure of ZnO for all samples. The films exhibited wurtzite (102) preferential growth in different thicknesses. Grain size values calculated from Scherrer’s formula, were varied in range of (96-84) nm. The band gap energy values were calculated respectively for Te thickness samples
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
