Abstract
Scanning electron microscopy, Auger electron spectroscopy, emissometer and reflectometer measurements have been made on anodic oxide coatings on aluminum prepared from solutions of phosphoric, chromic and sulfuric acid. The anodic oxide films are very porous, with the porosity greatest in films which were produced in phosphoric acid. A structural model for the oxide coatings has been generated from the data, and microstructural parameters for the model were defined. The IR emittance as well as the spectral hemispherical reflectance of the oxides have been measured as a function of film parameters, with specific emphasis on optimization of optical properties for use of the coatings as the matrix material for solar absorber coatings.
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