Abstract
Measurements of the reflectivity and the transverse Kerr effect for sputtered iron films on flat and structured substrates reveal, for the first time, anomalies in both the optical and magneto-optical behaviour of the structured samples. The presence of anomalies in the transverse Kerr effect measurements, for various orders of diffraction, is much clearer than in those of reflectivity. The results are discussed in terms of the anticipated Rayleigh condition for optical anomalies and the condition for the generation of surface plasmons in iron.
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