Abstract
Nanosized films with ferromagnetic layers are widely used in nanoelectronics, sensor systems and telecommunication. The physical and magnetic properties of nanolayers may significantly differ from those known for bulk materials due to fine crystalline structure, influence of interfaces, roughness, and diffusion. In this work, we are employing a spectral ellipsometry method, magneto-optical Kerr magnetometry and VSM to investigate the impact of layer thickness on the optical constants and magnetization processes for two and three layer films of the type Al/NiFe/sitall, Al/Ge/NiFe/sitall on sitall substrate for different thickness of the upper Al layers. The refractive indexes of two layer films are well resolved by spectral ellipsometry demonstrating their good quality. Modelling data for three-layer films show considerable discrepancy with the experiment, which can be related to a stronger influence of interfaces. The magnetization processes of two-layer films weakly depend on the type and thickness of the upper non-ferromagnetic layers. However, the coercivity of three layer films may significantly change with the thickness of the upper layer: more than twice when the thickness of Al layer increases from 4 to 20 nm.
Highlights
Thin films with magnetic layers are an important class of nanostructured materials for applications in nanoelectronics and spintronics [1,2]
The structure of multilayer films can be complicated by the need to protect the functional layers, with the physical properties of interest
We have found that the hysteresis curves of three-layer films undergo significant changes depending on the thickness of the upper nonmagnetic layer
Summary
Thin films with magnetic layers are an important class of nanostructured materials for applications in nanoelectronics and spintronics [1,2]. Considerable interest in such systems is related to a possibility of strengthening and modifying the magneto-optical effects, for example, by excitation of long-living modes of surface plasmon polaritons [3], or by spatial diffusion of spins in the ferromagnetic layers [4,5,6]. The properties of thin films may differ significantly from those of bulk materials [7,8,9] This is due to the structural parameters such as the size of crystallites, the quality of the interfaces of intermediate layers, and diffusion. The task is to control the physical properties of the individual layers along with geometry and overall magnetic response
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