Abstract
This research paper demonstrates the successful deposition of fullerene C70 for application as an acceptor material in Schottky barrier organic solar cell (OSC) device with structure fluorine-doped-tin-oxide/molybdenumtrioxide/fullerene/lithiumfluoride/aluminium (FTO/MoO3/C70/LiF/Al) using vapor thermal deposition technique. Morphology analysis using field emission scanning electron microscopy (FESEM) shows the mesoporous nature of highly cross-linked C70 molecules in deposited C70 thin film. But more uniform C70 film with less porosity has been deposited with high evaporation rate. We report the optical and electrical characterizations which reveal the thin film to be useful in photovoltaic applications. To study optical absorption spectra over visible energy range, prepared samples have been characterized by ultraviolet–visible (UV–vis) absorption spectroscopy. Optical dielectric parameters and dispersion properties of samples are studied. Constant Photocurrent Method (CPM) is employed to measure the mid gap absorption spectra of fabricated device. Defect density of states (DOS) distribution, Urbach energy and steepness parameter are also evaluated. Current-voltage characteristics of device in dark as well as under illumination surmise the behavior of device similar as Schottky barrier OSC.
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