Abstract
This paper discusses the properties of two arylenevinylene oligomers thin films deposited by vacuum evaporation on different substrates. The morphology of the thin films was investigated by scanning electron microscopy and atomic force microscopy, and the optical properties by UV–Vis and fluorescence spectroscopy. The optical nonlinear phenomenon of two-photon absorption induced fluorescence has been evidenced in the thin films of these compounds. We have also investigated the electrical properties of semiconductor/insulator/semiconductor (ITO/oligomer/Si) heterostructures in correlation with the contact energetic barriers, morphological and structural properties of the layers.
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