Abstract

A series of Ag:Cu2O nanocomposite films were fabricated on MgO (100) substrates by pulsed laser deposition. The effect of Ag content on the structure and morphology of the films was systematically investigated using transmission electron microscopy, X-ray diffraction, and in-situ X-ray photoelectron spectroscopy. The results show that Ag nanoparticles were embedded in Cu2O, while Cu0 and Cu2+ were not present on the films. The optical properties of the films were measured with a UV–vis photometer, while the electrical properties were characterized with a Hall measurement system. The optical absorbance of the films increased as the Ag content increased. Meanwhile, the resistivity of the films was decreased owing to single crystalline Ag forming in the nanocomposite.

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