Optical and electrical characterization of the electron beam gun evaporated TiO 2 film

Abstract

We report measured evolutions of the optical band gap, refractive index and relative dielectric constant of TiO 2 films obtained by electron beam gun evaporation and annealed in an oxygen environment. A negative shift of the flat band voltage with increasing annealing temperatures, for any film thickness, is observed. A dramatic reduction of the leakage current by about four orders of magnitude to 5×10 −6 A cm −2 (at 1 MV cm −1) after 700°C and 60 min annealing is found for films thinner than 15 nm. The basic carrier transport mechanisms at different ranges of applied voltage such as hopping, space charge limited current and Fowler–Nordheim is established. An equivalent SiO 2 thickness in order of 3.5 nm is demonstrated.