Abstract
Scanned-probe techniques are providing nanometer-resolution images of surface properties and surface features. In this contribution we suggest a technique identifying these features by locally recording their optical spectra. The technique is based on a simple modification to a scanning force microscope where an optical beam is focused onto the sample and the change in contact potential difference between tip and sample is measured as a function of laser wavelength. The change in contact potential difference can be due either to local heating or to a change in the surface dipole moment caused by optical excitation of sample and/or tip. Initial results of spectra and images of Au on mica and Cr are presented.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.