Abstract
Mesoporous SiO2 composite films with small Ag particles or clusters dispersed inthem were prepared by a new method: first the matrix SiO2 films were preparedby the sol–gel process combined with the dip-coating technique; then they weresoaked in AgNO3 solutions; this was followed by irradiation with γ-raysat room temperature and ambient pressure. The structure of these films wasexamined by high-resolution transmission electron microscopy, and theiroptical absorption spectra were examined. It has been shown that theAg particles grown within the porous SiO2 films are very small and arehighly dispersed. On increasing the soaking concentration and subjectingthe samples to an additional annealing, a different peak-shift effect forthe surface plasmon resonance was observed in the optical absorptionmeasurement. Possible mechanisms of this behaviour are discussed in this paper.
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