Abstract
We present measurements of the penetration depth λ(T) in YBa2(Cu1-xNix)3O7(x=.04,..06) and pure YBa2Cu3O7 films obtained from the T dependence of the mutual inductance of two coaxial coils on opposite sides of the films. λ(0) increases by a factor of 5 with 4% Ni and a factor of 10 with 6% Ni. The data are well fitted by the function λ(T)=λ(0)/(1-T2/Tc2)1/2 over the entire temperature range from 7K to Tc, implying at low temperatures λ(T)≈λ(0)(1+αT2/Tc2) with a coefficient α that is independent of nickel concentration.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
