Abstract

The Materials Science (MS) beamline at SESAME (Synchrotron-light for Experimental Science and Applications in the Middle East), dedicated to the X-ray powder diffraction technique, started its operational phase in December 2020 by hosting its first users. The MS endstation comprises a two-circle diffractometer coupled with a PILATUS 300K area detector, with which direct beam images are collected and compared with the initial ray-tracing simulation results. We present a detailed description of the beamline components and the experimental characterization of the main instrumental parameters relying on the instrumental profile and the angular resolution. A representative example for microstructure investigations of a nanocrystalline material is demonstrated.

Highlights

  • X-ray diffraction (XRD) beamlines are commonly among the high-priority beamlines because of their wide range of applications in diverse fields, such as materials science, biology, pharmacology and cultural heritage

  • The Materials Science (MS) beamline is the third operational beamline at SESAME, following on from the XAFS/XRF beamline, which started its operational phase in November 2017, and the IR beamline, which began operation in 2018

  • The MS beamline consists of three main sections: the frontend, the optics hutch and the experimental station, located after the wiggler source which consists of an array of NdFe:B permanent magnets (Gozzo et al, 2004; Patterson et al, 2005)

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Summary

Introduction

X-ray diffraction (XRD) beamlines are commonly among the high-priority beamlines because of their wide range of applications in diverse fields, such as materials science, biology, pharmacology and cultural heritage. The MS beamline is based on a wiggler source producing a high flux of the order of 1013 photons sÀ1 at the sample location at 10 keV (calculated for a full current of 400 mA). The beamline energy range is 5–25 keV, the energy resolution is about 2 eV and the effective beam size at the sample is 300 mm  2800 mm. Energy range (keV) Accepted divergence (mrad) Flux at the sample at 10 keV (photons sÀ1) Energy resolution (eV) Effective beam size at the sample (FWHM) (mm). A revised layout is presented for the beamline, a full experimental analysis is carried out for the beamline endstation parameters and a comparison is made with the theoretical ray-tracing results. Some preliminary experiments measured at the beamline are outlined

Outline for MS layout
Front-end section
Optical section
Experimental section
Beam shape
Instrumental angular resolution
Case study: line profile analysis for nanocrystalline fluorites

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