Abstract
SPM (Scanning Probe Microscope) provides three-dimensional with nanometer level resolution, and some of them can be used as metrology tools. However, SPM's images are commonly distorted by non-ideal properties of SPM's piezoelectric scanner, which reduces metrological accuracy and data repeatability. In order to eliminate this limit, an open-loop method is presented. In this method, the positional values of sampling points in all three directions on the surface of the sample are measured by the position sensor and recorded in SPM's image file, which is used to replace the image file from a conventional SPM. Because the positions in X and Y directions are measured at the same time of sampling height information in Z direction, the image distortion caused by scanner locating error can be reduced by proper image processing algorithm.
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