Open-loop electrooptic sampling for real-time analysis and near-field imaging of ultrafast electronic devices

Abstract

In this paper, we present an open-loop electrooptic sampling system for real-time characterization and near-field scanning of ultrafast electronic devices. The system capabilities such as picosecond time resolution as well as 210 GHz of measurement bandwidth are verified with measurement of a CMOS nonlinear transmission line and an ultimate bandwidth of 230 GHz has been achieved with a post-process algorithm. The noise of the system is quantified and imaging over a broad range of frequencies for an on-chip antenna is demonstrated.