Abstract
For accurate electron temperature and density diagnostics in laser high-temperature plasma implosion, opacity of Krypton (Kr) helium-[Formula: see text] and Balmer-[Formula: see text] lines are discussed, and ratio of escape factor of the two X-rays are calculated, both for Gaussian and Holtzmarkian profiles. Finally, the line ratios of the two X-ray lines are analyzed for optically thin and thick plasmas. Results indicate that for the Gaussian profile, the line ratio varies greatly with the opacity of the Kr helium-[Formula: see text] line, which provides excellent source for temperature and electron density diagnostics; while for the Holtzmarkian profile, the line ratio varies less with the opacity of the Kr helium-[Formula: see text] line, which can be used for escape factor diagnostics. This method is significant in accurate plasma diagnostics using X-rays under the condition of optically thick.
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