On-line testing of coexistent stuck-at and open faults in NoC interconnects

Abstract

More metallic wires are allied on ever shrinking chip die to meet the bandwidth requirements resulting many manufacturing faults- short, stuck-at, and open. Works on test of network-on-chip (NoC) interconnects mainly target short and/or stuck-at faults on the assumption that an open fault does not coexist on the interconnects. In addition, these works are either topology-centric or offer high test time. Here, we present an online strategy that addresses coexistent stuck-at and open faults in NoC interconnects and analyzes network performances as the effects of these faults.