Abstract
Rapid progress in graphene engineering has called for a simple and effective method to determine the lattice orientation on graphene before tailoring graphene to the desired edge structures and shapes. In this work, a wavelet transform-based frequency identification method is developed to distinguish the lattice orientation of graphene. The lattice orientation is determined through the different distribution of the frequency power spectrum just from a single scan line. This method is proven both theoretically and experimentally to be useful and controllable. The results at the atomic scale show that the frequencies vary with the lattice orientation of graphene. Thus, an adjusted angle to the desired lattice orientation (zigzag or armchair) can easily be calculated based on the frequency obtained from the single scan line. Ultimately, these results will play a critical role in wafer-size graphene engineering and in the manufacturing of graphene-based nanodevices.Electronic supplementary materialThe online version of this article (doi:10.1186/s11671-016-1553-z) contains supplementary material, which is available to authorized users.
Highlights
Graphene has been known as the replacement for silicon due to its unique electronic, physical, and mechanical properties as well as its wide range of applications [1, 2]
The relationship between the frequency and lattice orientation has been further investigated based on wavelet transforms
To identify graphene lattice orientations, we propose a model based on the frequency ratio
Summary
Graphene has been known as the replacement for silicon due to its unique electronic, physical, and mechanical properties as well as its wide range of applications [1, 2]. Several different graphene patterning methods such as Catalytic Cutting Technique [16,17,18,19], SPM-based Electric Field Tailoring Technique [20,21,22], AFM Scratching Technique [23, 24], Photocatalytic Patterning Approach [25], and Energy Beam Cutting method [26,27,28] have been developed. Whatever the cutting technique is, one of the prerequisites for tailoring graphene into desired nanodevice is to know its original lattice orientation, based on. A wavelet transform-based frequency ratio identifying method is developed to determine the lattice orientation of graphene theoretically and experimentally. The uniqueness of the proposed method lies in using one
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