Abstract

Reproducible size and morphology of metal–organic framework (MOF) particles are essential for tuning these materials for applications like heterogeneous catalysis. Particle size measurements from electron micrographs provide information about the impact of changing synthetic parameters on MOF growth, but reported data are usually limited to averages and statistical distributions. Further elucidating synthetic control parameters could facilitate studies of facet-dependent and non-classical growth mechanisms. In this work, phase-pure nanoparticles of the MOF UiO-66 were synthesized using alternating spikes of zirconium and hafnium-based nodes, forming an onion-like structure with alternating layers of Zr-UiO-66 and Hf-UiO-66. In conventional, bright-field transmission electron micrographs, Hf-UiO-66 and Zr-UiO-66 layers appeared darker and lighter, respectively. Alternating layers of Hf-UiO-66 and Zr-UiO-66 were also apparent in elemental maps obtained using scanning transmission electron microscopy with energy-dispersive X-ray spectroscopy. Average particle sizes increased monotonically with each spike, and no Zr-only or Hf-only particles were observed after the first spike, indicating that new material was consistently incorporated onto existing seeds. Surface area of the onion-like particles and their uptake of Ni2+ from solution were both between the values measured for Zr-UiO-66 and Hf-UiO-66. Results demonstrate the use of sequential spikes of nodes in monitoring crystal growth in MOFs.

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