One-wavelength in-plane rotation analysis in electronic speckle pattern interferometry

Abstract

The analysis of in-plane rigid-body rotations requires phase-shifting methods to determine the direction of rotation in conventional electronic speckle pattern interferometry (ESPI). The phase-shifting procedure makes the real-time measurements impossible. A quasi-real-time method is published recently, where the usual symmetric illumination is combined with a wavelength change before the second exposure. The present paper proposes a device sparing an alternative to this. The symmetric illumination is retained but the wavelength change is replaced by simple illumination direction changes.