Abstract
Thermal transport properties are important criteria for evaluating the properties of various fascinating micro/nanoscale materials. Over the past decades, characterization and study of the potential mechanisms of the in-plane and out-of-plane thermal conductivity of micro/nanostructures has attracted extensive attention in both experiment and theory. The transient electro-thermal (TET) technique is one of the fastest and accurate method for characterizing thermal conductivity, thermal diffusivity, thermal reffusivity and specific heat of one-dimensional materials simultaneously. In this review, the recent research progress in developing the TET technique for measurements of thermal transport in one dimensional micro/nanoscale structures is summarized. Also, the differential TET and extension of TET are reviewed in slightly more detail, including TPET, PLTR and PLTR2 techniques.
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