Abstract
We numerically demonstrate one-way zero reflection using the transfer matrix method. Using simulations, we adjusted the thickness of SiO2 layers in a simple SiO2-Au-SiO2 layer structure. We found two solutions, 47 nm-10 nm-32 nm and 71 nm-10 nm-60 nm, which are the thicknesses for one-way zero reflection at a wavelength of 560 nm. We confirmed it with reflection spectra, where reflectance is zero for forwardly incident light and 2.5% for backwardly incident light at the wavelength 560 nm, and thickness 47 nm-10 nm-32 nm.
Highlights
In order to confirm one-way zero reflection, we calculated the reflectance of the simulated structures: SiO2 (32 nm)-Au(10 nm)-SiO2 (47 nm) and SiO2 (60 nm)-Au(10 nm)SiO2 (71 nm)
The blue solid curve is for the reflectance of forwardly incident light, the black dashed curve is for the reflectance of backwardly incident light
The blue solid curve shows the transmittance of forwardly incident light; the black dashed curve shows the transmittance of backwardly incident light
Summary
In order to satisfy PT-symmetry in optics, one should consider optical gain and loss in the system which, in turn, means ε should be represented as a complex number This has been demonstrated many times in previous research [4,5,6,7]. One of the interesting phenomena in systems with PT-symmetry is the existence of an exceptional point. Exceptional point exists at the threshold where an eigenvalue changes from a real number to a complex number or vice versa. This behavior seems to be similar to that seen with degenerate states.
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