One high performance technology of infrared scene projection

Abstract

Infrared scenes generation technologies are used to simulate the infrared radiation characteristics of target and background in the laboratory. They provide synthetic infrared imagery for thermal imager test and evaluation application in the infrared imaging systems. At present, many Infrared scenes generation technologies have been widely used, and they make a lot of achievements. In this paper, we design and manufacture one high performance IR scene generation technology, and the whole thin film type transducer is the key, which is fabricated based on micro electro mechanical systems (MEMS). The specific MEMS technological process parameters are obtained from a large number of experiments. The properties of infrared scene generation chip are investigated experimentally. It achieves high resolution, high frame, and reliable performance, which can meet the requirements of most simulation system. The radiation coefficient of the thin film transducer is measured to be 0.86. The frame rate is 160 Hz. The emission spectrum is from 2μm to 12μm in infrared band. Illuminated by the visible light with different intensities the equivalent black body temperature of transducer could be varied in the range of 290K to 440K. The spatial resolution is more than 256×256.The geometric distortion and the uniformity of the generated infrared scene is 5 percent. The infrared scene generator based on the infrared scene generation chip include three parts, which are visual image projector, visual to thermal transducer and the infrared scene projector. The experimental results show that this thin film type infrared scene generation chip meets the requirements of most of hardware-in-the-loop scene simulation systems for IR sensors testing.