On-Chip Testing of Linear Time Invariant Systems Using Maximum-Length Sequences

Abstract

With the rapid development of system-on-chip (SoC) applications, containing digital and analogue parts, the need for fast and reliable on-chip testing methods has become obvious. We present a method for a fast and accurate broadband determination of the behaviour of analogue and mixed-signal circuits. This technique is based on impulse response (IR) evaluation using pseudo-random Maximum-Length Sequences (MLS). This approach provides a large dynamic range and is thus an optimal solution for measurements in noisy environments and for low-power test signals. We will show the algorithms of the MLS generation and of the impulse response calculation which can be easily implemented on-chip.