Abstract

Photon angular momentum (AM) has been widely studied due to its unique properties. The accurate detection of photon AM is very important in its wide applications. Though various on-chip AM detectors based on surface plasmon polaritons (SPPs) have been proposed, most of them can only realize relative measurement. For example, most photon orbital angular momentum (OAM) detectors measure the high order OAM via measuring the relative interval between the intensity spots of the SPPs excited by the target order OAM beam and the reference order (usually 0th order) OAM beam. In this paper, we propose a simple on-chip photon AM detector. It can realize absolute measurement of photon OAM via angle detection, whose measurement result does not depend on the measurement of any reference OAM beam. At the same time, it can also recognize photon spin angular momentum (SAM). The proposed detector provides a new way for absolute measurement of photon AM, which may have some potential applications in the field of integrated photonic device.

Highlights

  • On-Chip Photon Angularspin angular momentum (SAM) and orbital angular momentum (OAM) in the same structure, the SAM and OAM can even be detected at the same time [19–22]

  • Photonics Research Center, School of Optoelectronic Engineering, Guilin University of Electronic Technology, Guangxi Key Laboratory of Optoelectronic Information Processing, Guilin University of Electronics

  • These methods can only realize relative measurement; for example, the photon orbital angular momentum (OAM) detectors measure the high order OAM via measuring the relative interval between the intensity spots of the surface plasmon polaritons (SPPs) excited by the target order OAM beam and the reference order OAM

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Summary

On-Chip Photon Angular

SAM and OAM in the same structure, the SAM and OAM can even be detected at the same time [19–22] These schemes undoubtedly greatly reduce the volume of photon angular momentum detectors and improve system integration. These methods can only realize relative measurement; for example, the photon OAM detectors measure the high order OAM via measuring the relative interval between the intensity spots of the SPPs excited by the target order OAM beam and the reference order (usually 0th order) OAM beam; and the study of chip integrated methods for absolute OAM measurement is lacking. We propose a simple on-chip photon angular momentum detector It can realize absolute measurement of OAM via angle detection, whose measurement result is not affected by the amplification factor and does not depend on any reference OAM beam. It provides a new way for absolute measurement of photon angular momentum

Investigation and Discussion
Conclusions
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