Abstract
In this article, we discuss the recent use of the high-resolution dynamic atomic force microscopy (DAFM) in mapping the nano-scale dynamical structural heterogeneity in thin film metallic-glasses (TFMGs). Our focus is laid on the major factors which can influence the structural contrast in the DAFM images, such as tip radius, free-amplitude, set-point amplitude and surface roughness. Finally, through a comparative study of different TFMGs and single-crystal silicon, we demonstrate that the DAFM technique is effective in distinguishing different nanostructures through their energy dissipation spectra.
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