Abstract
The thickness of the disturbed layer in a quartz powder with an average particle size of 1·5 μm has been determined by chemical analysis combined with x-ray peak intensity measurements. At the same time a lower limit to this thickness has been determined by an x-ray diffraction line-profile method, developed earlier by the authors. The difference between both results (0·09 and >or=0·22 μm respectively) may be accounted for, at least partly, by accepting `locked strains' in the deformed crystals.
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