Abstract
The effect of temperature delocalization in semiconductor lasers (emission wavelength λ = 1060 nm) based on symmetric and asymmetric separate-confinement heterostructures fabricated by metal-organic vapor-phase epitaxy (MOVPE) is studied. Experimental and calculated estimates show that the carrier concentration in the waveguide increases by an order of magnitude when the temperature of a semiconductor laser is raised by ∼100°C. It is found that an increase in the temperature of the active zone leads to enhancement of the temperature delocalization of both electrons and holes. It is shown that the delocalization of holes begins at higher temperatures, compared with that of electrons. It is demonstrated experimentally that the onset of temperature delocalization depends on the threshold carrier concentration in the active region of a laser at room temperature. It is found that raising the energy depth of the active region by choosing the waveguide material makes it possible to fully suppress the temperature-delocalization process up to 175°C.
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