Abstract
Microchannel plate surfaces are studied by means of a laboratory spectrometer for fluorescence analysis and a synchrotron radiation source. Methods of mathematical statistics make it possible to estimate the degree of homogeneity and compare the chemical composition of the surfaces of different microchannel-plate samples. The conditions are determined, under which a synchrotron radiation beam excites X-ray fluorescence that propagates in the hollow microchannels. The X-ray diffraction and spatial distribution of fluorescence at the exit of the microchannel plates for an energy corresponding to the region of anomalous dispersion near the SiL2,3 absorption edges are studied experimentally and theoretically. In the long-wavelength X-ray radiation range, the relationship between the elemental composition of the microchannel-plate surfaces and the angular distribution of synchrotron radiation transmitted through microcapillaries is studied.
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