On the structure of some electron impact induced fragmentation products of Si(C 6H 5) 4, Ge(C 6H 5) 4 and Sn(C 6H 5) 4

Abstract

The electron impact mass spectrometric behaviour of tetraphenyl derivatives of Si, Ge and Sn is discussed on the basis of results of exact mass measurements, linked scans, mass analysed ion kinetic energy spectrometry, and collisional experiments. The possible structures of fragment ions are discussed, and the relevance of the findings to solution chemistry is considered.