Abstract
In this brief, the calculation of the signal behavior and the achievable signal-to-quantization-noise ratio of continuous-time (CT) incremental sigma–delta (I-SD) analog-to-digital converters (ADCs) is described. The presented method allows for the analysis of I-SD ADCs in frequency domain, including the specific non-idealities of the CT modulator. In the state-of-the-art, it is described that the omission of the preceding sample-and-hold for the I-SD ADC alters the transfer characteristic compared to a Nyquist-rate converter. So far, for CT I-SD ADCs this behavior is only investigated via simulations. In this brief, the model of a discrete-time I-SD ADC is generalized and adapted for the CT case. This allows to analytically obtain the signal and noise transfer function of the I-SD ADC in frequency domain in combination with arbitrary reconstruction filters due to the utilization of the lifting method in a fast and accurate way.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Circuits and Systems II: Express Briefs
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
