Abstract

Abstract. It was recently found that spectral solar incident flux (SIF) as a function of the ultraviolet wavelengths exhibits 1/f-type power-law correlations. In this study, an attempt was made to explore the residues of the SIF with respect to the Planck law over a wider range of wavelengths, from 115.5 to 629.5 nm. Using spectral, Haar and Detrended Fluctuation analyses, we show that over the range from 10–20 nm to the maximum lag (≈ 500 nm), the SIF residues have a scaling regime with fluctuation exponent H ≈ 0.37 but with high intermittency (C1 ≈ 0.16, multifractal index α≈ 1.7) and spectral exponent ≈ 1.46. Over the shorter wavelengths range we found on the contrary low intermittency (C1 ≈ 0) with spectral exponent ≈ 1 and H ≈ 0.

Highlights

  • As is well known, electromagnetic radiation is continuously emitted by every physical body

  • To summarize our results we analyzed the detrended solar incident flux (SIF)-WL data set by using Haar analysis (Lovejoy and Schertzer, 2012a, b) using the software available at http://www.physics.mcgill.ca/~gang/software/doc/ haarpack.zip

  • The main conclusions of the present survey were: 1. detrending fluctuation analysis (DFA)-n applied on the detrended SIF data set revealed DFA-exponents close to unity

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Summary

Introduction

Electromagnetic radiation is continuously emitted by every physical body. By applying the DFA method on the various values of I (λ,T ), Varotsos et al (2013a) showed that the calculated I (λ,T ) values do not obey the 1/f -type scaling vs λ (i.e., for fluctuations in I (λ,T ) over a range λ in wavelength). The latter may reflect a scaling in its fluctuations which might be related to the complex physical processes taking place at the solar atmosphere (e.g. see Avrett and Loeser, 2008, and references therein). In the present study, focusing on these fluctuations, we examine whether the 1/f scaling feature is apparent in a wider spectrum of SIF including both UV and visible spectrum, namely for wavelengths (WL) between 115.5 and 629.5 nm

Data and analysis
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