Abstract
The role of disorder on the superconducting properties of Re 1( Nd x Ba 2-x ) Cu 3 O 7-δ (Re=Nd, Y) epitaxial thin films has been studied. The films are deposited by Ar+O 2 magnetron and diode dc sputtering from targets characterised by different x (0, 0.08 and 0.12). In situ X-ray Photoemission Spectroscopy (XPS), Scanning Tunneling Microscopy (STM), and non-conventinal X-ray diffraction measurements have been used to determine the exact composition and the structural properties of each sample. The temperature dependence of the ab-plane penetratin depth of highly c-axis epitaxial samples, characterised by different Nd/Ba ratios, has been determined by an inverted microstrip resonator technique. Results on the Nd 1+x Ba 2-x Cu 3 O 7-δ system show that only stoichiometric films exhibit a linear penetration depth at low temperature while Nd-rich films show a T 2 law. Preliminary measurements on the Y 1( Nd x Ba 2-x ) Cu 3 O 7-δ system confirm these results. The data are analysed in the framework of the d-wave model taking into account the effect of impurities on the superconducting properties.
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