Abstract
The polarization dependence of the cross sections of two-photon transitions including X-ray scattering was analyzed. We developed the regular approach to the derivation of the polarization parameters of photoprocesses. Our approach is based on the tensor representation of the photon density matrix, which is written in terms of the unit vectors directed along the major axis of the polarization ellipse (ϵˆ) and the photon propagation (kˆ). Explicit expressions for the product of two photon density matrices were derived. As an example, the parametrization of the polarization dependence of the X-ray scattering by closed-shell atoms is given both in terms of (i) scalar products of photon vectors ϵˆ1,2, kˆ1,2 and (ii) X-ray Stokes parameters. We discuss the applicability of the atomic scattering for the measurement of the polarization of X-rays.
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