On the paper “Mechanism of thermal runaway as a cause of Fleischmann-Pons effect,” by N.E. Galushkin et al. Published in the Journal of Electroanalytical Chemistry, 870, pp. 114237–114246 (2020), ISSN 0022-0728

Abstract

The paper “Mechanism of Thermal Runaway as a Cause of Fleischmann-Pons Effect,” by N.E. Galushkin, N.N. Yazvinskaya, D.N. Galushkin, published in the Journal of Electroanalytical Chemistry, 870, pp. 114,237 – 114,246 (2020), ISSN 0022-728, does not contain enough data on the study of nuclear reactions in CF materials that accompany the Fleischmann-Pons effect. Therefore, it is necessary to add an overview of these studies based on the data written in the papers by Fleischmann et al. and data including the paper by Morrey et al. and others obtained in these about 30 years.