Abstract

Ionic liquids have recently been used as means of modulating the charge carrier properties of cuprates. The mechanism behind it, however, is still a matter of debate. In this paper we report experiments on ionic liquid gated ultrathin La2−xSrxCuO4 films. Our results show that the electrostatic part of gating has limited influence in the conductance of the cuprate in the gate voltage range of 0 to V. A non-electrostatic mechanism takes over for gate voltages below V. This mechanism most likely changes the oxygen concentration of the film. The results presented are in line with previous X-ray based studies on ionic liquid gating induced oxygenation of the cuprate materials YBa2Cu3O7−x and La2−xSrxCuO4.

Highlights

  • Changing the charge carrier density by means of gating is the crux of today’s technology, where fields of up to 10 MV/cm are used in transistors to change semiconductor properties

  • Dubuis et al [11] argued that the electric field of the electric double layer drives a redistribution of the oxygen atoms in the basal planes of the cuprate in an electrostatic fashion, while others have suggested an electrochemical process leading to oxygenation of the cuprate [12,13]

  • We observe that ionic liquids (ILs) gating induces superconductivity in La1.95Sr0.05CuO4, even when the film has a thickness of 30 unit cells (UC) (Figure 1A)

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Summary

Introduction

Changing the charge carrier density by means of gating is the crux of today’s technology, where fields of up to 10 MV/cm are used in transistors to change semiconductor properties. With a ∼1 nm separation within the double layer charge carrier densities of up to 8 × 1014 cm−2 are achievable [1], making it possible to induce insulator-to-superconductor [2,3,4] and metal-to-insulator transitions [5,6,7]. This technique is driven by an electrostatic mechanism, and holds for many materials [8,9].

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