Abstract
In this paper, the capacitance and inductance of afour-line transmission structure is characterized. The procedure used wasdeveloped by Ymeri et al for general analysis ofmultilayer multiconductor interconnects for specific applications inmicroelectronics. The characterization is based on the determination of thequasi-static electric scalar potential in the structure making up thefour-line interconnect. Using the electric potential, the mutualcapacitances and inductances are found. The characterization of thefour-conductor structure is significantly different from the simple conductorpair because the symmetry of the pair is lost. A number of numerical resultsare calculated and presented.
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