Abstract
The paper discusses the influence of statistical errors in measuring the intensity of a spectral line on the exact determination of its wavelength. Using simplifying assumptions, it is shown that the relative error in measuring the wavelengths of spectral lines of the same type, caused by the statistical character of X-ray intensity measurements and by the influence of the true width of the spectral line, is practically constant under the same conditions, i.e. it is independent of the lattice parameters of the crystals used and of the wavelength of the spectral line. It seems that the latest exact measurements of Bearden confirm this result.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
