Abstract
The paper discusses the influence of statistical errors in measuring the intensity of a spectral line on the exact determination of its wavelength. Using simplifying assumptions, it is shown that the relative error in measuring the wavelengths of spectral lines of the same type, caused by the statistical character of X-ray intensity measurements and by the influence of the true width of the spectral line, is practically constant under the same conditions, i.e. it is independent of the lattice parameters of the crystals used and of the wavelength of the spectral line. It seems that the latest exact measurements of Bearden confirm this result.
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