Abstract

This work investigates internal damage by void growth in NT microstructures via crystal plasticity. The framework incorporates length-scale effects and explicitly models twin boundary migration. Using finite-deformation, plane strain finite element calculations of porous unit cells, we analyze the roles of twin size, plastic anisotropy and twin boundary migration on void evolution over a range of controlled biaxial stress states. The simulations provide insights into crystallographic aspects of porosity growth in NT microstructures. Emphasis is placed on correlating the micromechanics of failure by internal necking. Irrespective of the level of crystallographic plastic anisotropy, twin boundary migration effectively shields the void growth process, delaying the porosity evolution compared to non-twinned microstructures. It is found that crystallographic plastic anisotropy causes kink band instability that can affect void growth. Coupled with twin boundary mobility, twin size and crystallographic plastic anisotropy create a rich landscape of failure characteristics as a function of the stress state.

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