On the measurement of hardness at high strain rates by nanoindentation impact testing

Abstract

Recent advances in electronics have enabled nanomechanical measurements with very low noise, fast time constants and high data acquisition rates. These capabilities open the door for a wide range of ultra-fast nanomechanical testing. Given the inherent dynamic nature of high-speed testing, a thorough understanding of the testing system's dynamics and electronics is extremely important for accurate measurements. In this work, an analytical framework that includes the mechanical and electronic contributions of the instrument and the material constitutive response is presented to provide guidelines for performing high strain rate measurements of hardness by nanoindentation testing. Simple closed-form solutions that provide insights on the choice of test methodology, test parameters and instrument design are presented along with the strain rate range over which accurate measurements can be performed with commercially available nanoindenters.