Abstract
Abstract Section topographs of a wedge-shaped silicon single crystal have been taken by plane-wave X-ray topography with (+,+,−) setting. A topograph taken with plane waves with the exact Bragg condition has no ‘hot margin’ effect, which is always observed when spherical waves are used. When the crystal is tilted slightly from the exact Bragg condition, the margin effect is observed. The intensity of the edges of the pattern, however, shows asymmetry caused by the anomalous absorption of X-rays in a crystal.
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