Abstract
The resolution of the field emission electron microscope is expressed as a function of the ratio of its magnification M to the time-of-flight τ of an electron from emission tip to screen. It is shown that small protrusions on the surface of the tip can provide areas for which M is much greater than that computed for a perfectly smooth tip. Resolution of the order of 3 A is possible on these protrusions, so that some of their atomic detail should be observable.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
