On the implementation of the LZZ calibration technique in the S-parameters measurement of devices mounted in test fixtures

M A Pulido-Gaytan,M C Maya-Sanchez,J A Reynoso-Hernandez,A Zarate-De Landa,J R Loo-Yau

doi:10.1109/arftg.2015.7162916

On the implementation of the LZZ calibration technique in the S-parameters measurement of devices mounted in test fixtures

M A Pulido-Gaytan, M C Maya-Sanchez + Show 3 more

https://doi.org/10.1109/arftg.2015.7162916

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Publication Date: May 1, 2015

Citations: 8

Affiliation: Center for Scientific Research and Higher Education at Ensenada, Center for Research and Advanced Studies of the National Polytechnic Institute

#Test Fixtures #Calibration Technique + Show 7 more

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Abstract

This paper introduces a methodology for the design and verification of the set of microstrip structures necessary to implement the line, offset-open, offset-short (LZZ) calibration technique in the small-signal characterization of devices mounted in coaxial-to-microstrip test fixtures. The usefulness of the LZZ calibration in such application is verified by comparing the S-parameters of a GaN-HEMT packaged transistor corrected using the LZZ with those corrected using the thru-reflect-line (TRL) calibration technique.

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