Abstract
The ferromagnetic interlayer coupling in sputter-deposited permalloy/copper/permalloy exchange-biased spin valve multilayers has been measured as a function of the copper thickness. The variation with thickness may, for t/sub cu/>1.7 nm, be analyzed in terms of the Neel model for magnetostatic coupling due to correlated interface roughness, using parameters which are consistent with the observed microstructure.
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