Abstract
The intrinsic fluctuation in ionization energy loss of a charged particle has been found to be the limiting factor in the charge resolution of track-etch detectors. The detector appears to respond to restricted energy loss in a binary on-off mode on microscopic scales, resulting in an excellent charge resolution, a wide dynamic sensitivity, and a tunable charge threshold. A statistical approach to the distribution of ionization energy loss is suggested in this paper. The method, based on the Edgeworth series, can be used to calculate the distribution of total energy loss and restricted energy loss for any absorber with an arbitrary thickness. Several previous treatments of thin and thick absorbers can be obtained as asymptotic limits in the new formalism. Numerical examples, together with Monte-Carlo verifications, are also presented.
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