On the electron impact ionization of silicon and metal containing organic molecules

Abstract

Calculation of electron impact total inelastic cross sections for three silicon containing organic molecules (Trimethylsilane, Tetraethoxysilane and Hexamethyldisiloxane) and three organometallic complexes (Cyclopentadienyltrimethyl-platinium, Bismethylcyclopentadienyl-ferrum and Bismethylcyclopentadienyl-ruthenium) were performed employing spherical complex optical potential formalism. The complex scattering potential ionization contribution method was then used to derive total ionization cross sections from inelastic cross sections for these targets. The results presented here are for the incident electron energy ranging from ionization threshold to 2000eV. The comparison with existing measurement shows promising results.