Abstract
In X-ray intensity measurements, the counting statistical error is typically calculated as the square root of the number of counts collected. This, however, is an approximation in the sense that the effect of the dead time in the counting process has been ignored. In this work, the equations for calculation of the counting statistical error in X-ray fluorescence measurements will be derived, including the effect of the dead time of the counting chain. Copyright © 2016 PANalytical B.V. X-Ray Spectrometry Published by John Wiley & Sons Ltd.
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