Abstract
A method that allows the investigation of discharge transport mechanism in dielectric films used in MEMS capacitive switches or MIM capacitors or even bare dielectric films is presented. The method is based on monitoring the dielectric film surface or MIM top electrode potential decay rate and the dependence of conductivity on surface potential. The method has been applied in MEMS and MIMs with simultaneously deposited dielectric film to confirm the closeness of transport data in MIM and MEMS devices. The impact of non-uniform charging on local discharge rate and different dielectric film stoichiometry has been also assessed. Finally, the effect of surface leakage due to environment humidity has been also investigated. [2019-0159].
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
