Abstract
The application of the two-and-a-half-dimensional (2 1/2D) technique to the analysis of the nature of small point-defect clusters in ion-irradiated silver and copper has been explored. A modification of the technique which allows the identification of reciprocal-lattice spike effects has been made. However, even with this modification a comparison of analyses of the same clusters by 2 1/2D and the Black-White contrast method showed that 2 1/2D analyses of small faulted point-defect clusters are unreliable.
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