Year-end Sale % OFF 
Abstract
The present work is devoted to the investigation of structural changes accompanying the appearance of green and blue electroluminescence in thermally deposited SiO x : Tb ( x∼1) films as a result of high-temperature processing. The non-destructive optical methods, specifically, measuring transmission spectra in ultraviolet, visible, near and far IR area, and multiangle ellipsometry have been used for such a research. Analysis of the obtained experimental results allows to conclude that the annealing-stimulated structural transformations in a matrix of terbium doped silicon monoxide films occur at both microstructural and macrostructural levels and have an essential and complex influence on the film radiative performances.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
